Peter Kraus

Dr. Peter Kraus is an Associate Professor of Physics at Vrije Universiteit Amsterdam and Group Leader of the 'High-Harmonic Generation and EUV Science' team at ARCNL. Since July 2024, he has also served as Head of the Metrology Department at ARCNL. His research focuses on developing extreme ultraviolet (EUV) and nonlinear light sources for ultrafast spectroscopy and nanoscale metrology, with applications in nanolithography and strongly correlated materials. Kraus has pioneered techniques such as high-harmonic interferometry and super-resolution microscopy, enabling unprecedented nanoscale imaging without sample labeling.

He holds a PhD in Physics from ETH Zurich (2015), where his thesis on high-harmonic spectroscopy earned the ETH Medal and the Jankunas Award. His work bridges fundamental physics and applied metrology, with funding from ERC (Starting Grant 2022, Proof of Concept 2024), NWO (Veni, Vidi), and TTW. Key projects include the HIMALAYA initiative, which explores femtosecond electron dynamics in correlated materials using EUV microscopy.

Education: PhD in Physics, ETH Zurich (2015); Postdoctoral Research at UC Berkeley (2015–2018). Professional roles include leadership in ARCNL’s metrology division and academic teaching at Vrije Universiteit.

• Grants: ERC Starting Grant (2022), ERC Proof of Concept (2024), NWO Vidi (2023), NWO Veni (2018)
• Awards: ETH Medal (2015), Jankunas Award (2015)
• Labs/Teams: ARCNL’s High-Harmonic Generation Group, VU Physics Department

His research advances include ultrafast transient absorption spectroscopy, attosecond electron dynamics studies, and metrology innovations like harmonic deactivation microscopy. Current efforts target real-time imaging of quantum materials and developing EUV tools for semiconductor manufacturing.