معرفی
Dr. Yuri Barthel is a scientific staff member at the Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) within the Materials Science and Engineering department at Forschungszentrum Jülich. His research focuses on quantitative high-resolution transmission electron microscopy, electron diffraction, and advanced image simulation techniques.
His primary research interests include:
- Development of computational methods for electron microscopy
- STEM image and spectrum data processing
- Microscope and detector characterization
- Aberration measurement and correction techniques
Barthel is the lead developer of the Dr. Probe software package, which enables high-resolution STEM image simulations and is widely used in electron microscopy research. His 2018 publication demonstrates core algorithms for simulating electron probe propagation and imaging.
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