معرفی
Knut Urban is a Professor at Forschungszentrum Jülich GmbH, affiliated with the Ernst Ruska Center for Electron Microscopy and Spectroscopy (ER-C) and its department Physics of Nanoscale Systems (ER-C-1). His work focuses on advancing atomic-resolution electron microscopy techniques, particularly in aberration correction, quantitative structural analysis, and nanoscale materials characterization.
Recent research trends in his publications include:
- Aberration-corrected transmission electron microscopy (TEM)
- Atomic-scale disorder and defect analysis in crystals
- Dopant and potential mapping in semiconductors
- Terahertz spectroscopy and Josephson junctions
He has contributed extensively to understanding nanoscale phenomena in materials like ferroelectrics, semiconductors, and complex metallic alloys.
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