معرفی
Dr. Yan Lu is a researcher at Forschungszentrum Jülich's Physics of Nanoscale Systems (ER-C-1) institute. Her work focuses on advanced electron microscopy techniques, including off-axis electron holography, HAADF-STEM imaging, and in-situ TEM strain-stress deformation studies.
Research expertise:
- Electric field mapping via electron holography
- Charge distribution analysis under varied conditions
- Microstructure evaluation of strained materials
- Focused ion beam (FIB) sample preparation for metallic alloys and semiconductors
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