معرفی
Simon Astley is a Researcher in the Department of Physics at Aberystwyth University. His work focuses on semiconductor surface characterization, X-ray photoelectron spectroscopy (XPS), and optical imaging techniques. He is involved in the HarwellXPS National Research Facility project (2023–2028), advancing XPS applications in material science.
Education: He earned a Doctor of Philosophy (PhD) in 2020, with a thesis titled Characterisation of oxidation techniques on wide bandgap semiconductor surfaces, supervised by Dr. A. Evans and Prof. R. Cross.
Research Interests include nanomaterials, surface chemistry, and semiconductor physics. His studies explore surface modifications under environmental conditions (e.g., light exposure, ambient pressure) and optical enhancements for biomedical imaging.
His recent articles highlight trends in: (1) degradation mechanisms of self-assembled monolayers, (2) real-time XPS analysis of semiconductor surfaces, and (3) improving optical resolution for parasitic infection diagnosis.
He leads the HarwellXPS facility project, aimed at establishing a UK national resource for advanced XPS research, fostering collaborations in material innovation and surface science.
