معرفی
Sebastian Wood is a Principal Scientist at the National Physical Laboratory (NPL), specializing in nanoscale measurement techniques for emerging semiconductor materials. He holds a PhD in Physics from Imperial College London and leads projects in semiconductor metrology, standardization, and advanced materials research. His work focuses on developing scanning probe microscopy (SPM), optical spectroscopy, and wafer-scale metrology for semiconductor quality assurance. He chairs the BSI EPL/47 committee for semiconductor standards and contributes to international committees like IEC and ISO.
Education:
- PhD in Physics, Imperial College London
- Undergraduate studies in Physics, Imperial College London
Research Interests:
- Nanoscale metrology of 2D materials, hybrid perovskites, and compound semiconductors
- Advanced SPM and optical spectroscopy techniques
- Wafer-scale measurement systems for semiconductor manufacturing
- Pre-standards research for AI, quantum, and telecoms convergence
Key Projects:
- Coordinator of the EMPIR 'PowerElec' project on wide bandgap power electronics metrology
- International interlaboratory comparisons for graphene and semiconductor characterization
Labs & Facilities: Leads NPL's unique facility for nanometrology of emerging electronics, integrating structural, functional, chemical, and optical measurement modes.
