معرفی
Katayun Barmak is the Philips Electronics Professor of Applied Physics and Applied Mathematics at Columbia University's School of Engineering and Applied Science. She holds a joint appointment in the Department of Applied Physics and Applied Mathematics (APAM) and serves as a DSI Member. Her research focuses on materials science, particularly metallic thin films, nanowires, and transition metal dichalcogenides. She has over 200 peer-reviewed publications and four patents.
Education Affiliations:
- Lehigh University (Faculty, 1992–1999)
- Carnegie Mellon University (1999–2011)
Research Interests: Her work integrates experimental materials science with machine learning for microstructure analysis. Key areas include defect quantification in 2D materials, epitaxial electrodeposition for advanced interconnects, and optoelectronic properties of monolayer semiconductors. She pioneered methods for characterizing strain in graphene and nanoscale defects using scanning probe microscopy enhanced by AI.
Recognition:
- US NSF National Young Investigator Award (1994)
- IBM Materials Research Visiting Scientist Award (2004)
Grants & Labs: Principal Investigator on NSF DMREF grants studying grain growth and microstructure evolution. Collaborates with IBM Research and Ru (0001) thin film developers. Active in developing oxygen-free graphene synthesis methods and epitaxial metal interconnects.
