معرفی
Ivica Dj. Manic is a Full Professor at the Faculty of Electronic Engineering in Niš, University of Niš, specializing in Microelectronics and Microsystems. He has been a Full Professor since 2016 and holds a PhD in Microelectronics and Microsystems from the same institution (2006). His academic career includes a master's degree in Electronics Materials from Kanazawa Faculty of Technology (Japan, 1991) and a bachelor's degree from the Faculty of Electronic Engineering in Niš (1985). He further specialized at Kanazawa Faculty of Technology in 1988/89.
His research focuses on semiconductor device reliability, particularly Negative Bias Temperature Instability (NBTI) in power VDMOSFETs, material science, and microelectronics. He has authored/co-authored over 35 scientific papers with impact factors, contributing to journals such as Jpn. J. Appl. Phys., IEEE Transactions, and Semicond. Sci. Technol.
Prof. Manic has led or participated in 6 domestic projects funded by Serbia’s Ministry of Science and 6 international projects with institutions like the Institute of Solid State Physics (Bulgarian Academy of Sciences) and the National Center for Scientific Research 'Demokritos' (Greece). He coordinates Erasmus+ mobility projects at the University of Niš since 2015, managing international educational collaborations.
His work emphasizes semiconductor material characterization, device degradation mechanisms, and reliability under stress conditions. Recent studies investigate NBTI effects in power transistors and pulsed stress impacts on device performance.
