معرفی
Danijel M. Dankovic is a Full Professor at the Department of Microelectronics within the Faculty of Electronic Engineering, University of Nis. He holds positions as Head of Department, Assistant Editor of Microelectronics Reliability, and President of the scientific conference IEEESTEC. His academic journey includes a PhD (2009) and master’s degree (2006) in Microelectronics and Nanotechnology from the same faculty, alongside a bachelor’s degree in Electronics and Telecommunications (2001).
His research focuses on semiconductor reliability, particularly Negative Bias Temperature Instability (NBTI) in power devices, IoT applications, and nanotechnology. He has authored 35+ impact-factor papers and leads 4 national and 1 international research projects. His work bridges theoretical semiconductor physics with practical applications in power electronics and smart systems.
Publications highlight NBTI mechanisms in VDMOSFETs, IoT-enabled smart systems, and device reliability under irradiation. His educational contributions include innovative PCB design curricula and measurement methodologies for power transistors.
Awardees of his mentorship are not explicitly listed, but he supervises a dynamic research team. His lab’s activities align with the University of Nis’ broader research in microelectronics and control systems.
