معرفی
Farshid Manoocheri is a Researcher at the Department of Electrical Engineering and Automation, School of Electrical Engineering, Aalto University, affiliated with the Metrology Research Institute.
His research focuses on Optical Metrology and Radiometry, specializing in emissivity/reflectivity measurements for passive radiative cooling, BTDF characterization, and SI-traceable optical protocols. Key applications span Thin Film Characterization for nanotechnology and Remote Sensing systems, with emphasis on measurement accuracy for micro/nanostructures.
Analysis of his 10 recent publications (2023-2025) reveals three dominant trends: (1) Development of reference protocols for radiative transfer validation, (2) Advanced reflectometry techniques for multilayer nanostructures, and (3) Standardization of BTDF measurements across spectral ranges. His work consistently bridges fundamental metrology with energy-efficient technologies.
As an active member of the Metrology Research Institute, he contributes to international scale comparisons and primary reference facility development, collaborating with institutions across Europe on optical measurement standardization.
