معرفی
Gaël Obein is a Senior Lecturer (HDR) and Associate Professor at Conservatoire National des Arts et Métiers (CNAM) in Paris, France. He serves as Director of LNE-CNAM, the national metrology laboratory for radiometry, photometry, temperature, and length, and leads the 'Radiometrics/Photonics' team. His academic career spans roles at CNAM, Paris VI, NIST (USA), and MNHN, with a PhD in 'Physical Systems and Metrology' (2003) and HDR since 2019.
- President of French Lighting Association (AFE)
- Secretary of CIE Division 2
- Coordinator of four European research projects (2013–2027)
- Expert in BRDF, BSSRDF, and BTDF metrology
His research focuses on optical metrology for material appearance, including:
- High-angular-resolution goniospectrophotometry (0.015°)
- µBRDF measurements for 50µm surfaces
- Specular gloss perception studies
- Development of primary standards for BRDF/BSSRDF/BTDF
- Light polarization and speckle effects
Scientific Leadership includes:
- Secretary of CIE Division 2
- Director of CIE TC2-85 and JTC17
- Coordination of EURAMET-PR-K6 key comparisons
- Participation in 4 CIE technical committees
Publications (2023–2024) cover bidirectional reflectance distribution functions, gloss metrology, spectral irradiance traceability, and material appearance modeling. Projects include 'xDReflect', 'BiRD', 'BxDiff', and 'xDDiff', addressing multidimensional optical diffusion and appearance measurement standards.
