معرفی
Andrey Yakshin is an Assistant Professor at the MESA+ Institute. His research focuses on surface science, thin film technology, and materials characterization, particularly in studying interfaces using Low Energy Ion Scattering (LEIS) and advanced metrology techniques. He has contributed to understanding thin film growth dynamics, material interactions, and optical performance of multilayers for XUV wavelengths.
Key research interests include 2D materials, thin film interfaces, and nanostructured systems. His work addresses challenges in semiconductor interfaces, material thickness effects, and non-destructive analysis methodologies. Recent studies involve collaborations on W/Si interfaces and LEIS applications in nanoscale characterization.
Yakshin has presented at international conferences, delivering invited talks on topics like thin film metrology and adaptive piezoelectric actuators. His contributions span over 143 publications, with recent works published in journals such as Surfaces and Interfaces and Applied Surface Science.
He has supervised 10 research projects, advancing knowledge in surface engineering and optical materials. His work aligns with UN SDG goals related to sustainable industrialization and innovation through advanced material science.