معرفی
Professor Bharat Bhuva is a faculty member in the School of Engineering at Vanderbilt University, holding the position of Professor of Electrical Engineering and Computer Engineering. His research focuses on radiation effects on integrated circuits, semiconductor device modeling, and VLSI design, with an emphasis on advancing the resilience of nanoscale electronics against single-event effects and total-ionizing-dose damage. He also investigates emerging technologies like FinFET and FDSOI for improved radiation hardness and performance.
Education:
- Ph.D. in Electrical Engineering, North Carolina State University
- M.S. in Electrical Engineering, North Carolina State University
- B.S. in Electrical Engineering, Maharaja Sayajirao University
Research Interests: Professor Bhuva’s work spans computer-aided design tools, semiconductor process modeling, and the mitigation of radiation-induced failures in advanced integrated circuits. His studies address challenges posed by scaling to smaller technology nodes (e.g., 3-nm FinFET) and the impact of environmental factors like temperature, bias conditions, and neutron exposure on circuit reliability. Key areas include multicell upsets, single-event upset (SEU) cross-section analysis, and the efficacy of radiation-hardened-by-design (RHBD) techniques.
Awards & Recognition: None explicitly listed in the provided text. However, his extensive publications in top-tier journals like IEEE Transactions on Nuclear Science highlight his contributions to the field.
Grants & Advising: Advises on projects related to advanced semiconductor technologies and radiation effects. His research has been supported by grants from institutions focusing on space electronics and nanotechnology. No specific grant details or student advisees are listed.
Labs & Teams: Likely affiliated with Vanderbilt’s Cyber-physical Systems and Nano Science and Technology research neighborhoods, though specific lab names are not mentioned in the text.
