Dr. Chengmo Yang is a Professor in the Department of Electrical and Computer Engineering at the University of Delaware, with a joint appointment. She received her PhD and MSc in Computer Science from the University of California, San Diego, and a BSc in Microelectronics from Peking University, China. PhD, University of California, San Diego MSc, University of California, San Diego BSc, Peking University, China Her research focuses on enhancing security, reliability, non-volatility, and energy efficiency in embedded systems, cyber-physical systems (CPS), and Internet-of-Things (IoT). She leads the Computer Architecture, Reliability, and Security (CARES) group and has authored over 70 peer-reviewed publications. Recent publications emphasize neural network accelerators, non-volatile memory (NVM) optimization, and security frameworks for embedded systems. Her work explores fault tolerance, wear leveling, and side-channel attack mitigation in NVM-based FPGAs, STT-RAM, and SSDs. National Science Foundation Career Award (2013) University of Delaware Mid-Career Faculty Excellence in Scholarship Award (2020) Best paper award at ICESS (2019) Three best paper nominations at DAC, DATE, and GLSVLSI (2019) Dr. Yang serves as Associate Editor for IEEE TCAD and ACM TODAES. She is the Diversity & Inclusion Representative for IEEE CEDA and has organized numerous conferences including Technical Program Chair for CODES-ISSS 2022. Her lab has hosted current and former students like Fanruo Meng (PhD candidate), Fateme Hosseini (Qualcomm), and Patrick Cronin (Intel), focusing on graduate-level research in hardware security and reliability.












