معرفی
Dr. Chengmo Yang is a Professor in the Department of Electrical and Computer Engineering at the University of Delaware, with a joint appointment. She received her PhD and MSc in Computer Science from the University of California, San Diego, and a BSc in Microelectronics from Peking University, China.
- PhD, University of California, San Diego
- MSc, University of California, San Diego
- BSc, Peking University, China
Her research focuses on enhancing security, reliability, non-volatility, and energy efficiency in embedded systems, cyber-physical systems (CPS), and Internet-of-Things (IoT). She leads the Computer Architecture, Reliability, and Security (CARES) group and has authored over 70 peer-reviewed publications.
Recent publications emphasize neural network accelerators, non-volatile memory (NVM) optimization, and security frameworks for embedded systems. Her work explores fault tolerance, wear leveling, and side-channel attack mitigation in NVM-based FPGAs, STT-RAM, and SSDs.
- National Science Foundation Career Award (2013)
- University of Delaware Mid-Career Faculty Excellence in Scholarship Award (2020)
- Best paper award at ICESS (2019)
- Three best paper nominations at DAC, DATE, and GLSVLSI (2019)
Dr. Yang serves as Associate Editor for IEEE TCAD and ACM TODAES. She is the Diversity & Inclusion Representative for IEEE CEDA and has organized numerous conferences including Technical Program Chair for CODES-ISSS 2022.
Her lab has hosted current and former students like Fanruo Meng (PhD candidate), Fateme Hosseini (Qualcomm), and Patrick Cronin (Intel), focusing on graduate-level research in hardware security and reliability.
