Wen-Ben Jone

Wen-Ben Jone is an Associate Professor at the University of Cincinnati's Department of Electrical Engineering & Computing Systems. He previously held positions as Assistant/Associate Professor at New Mexico Institute of Mining and Technology and Visiting Associate/Full Professor at National Chung-Cheng University, Taiwan. His research focuses on VLSI system design, low-power circuits, and fault-tolerant testing methodologies. He has advised over 70 graduate students and authored/co-authored numerous papers in top-tier journals and conferences.

Education:

• PhD: Case Western Reserve University (Computer Engineering, 1987)
• MS: National Chao-Tung University (Computer Engineering, 1981)
• BS: National Chao-Tung University (Computer Science, 1979)

Research Interests:

• Reliable VLSI design and testing
• Low-power and fault-tolerant circuits
• Many-core processor architectures
• Parallel computing and debugging tools

Awards:

• 2003 IEEE Donald G. Fink Prize Paper Award
• 2008 Best Paper Award (International Symposium on Low-Power Electronics)
• 2012 Best Paper Award (VLSI Design, Automation & Test)

Grants:

• $390k NSF Grant (CCF-0541103) for cache optimization techniques

His work emphasizes practical solutions in VLSI testing and reliability, with a focus on low-power strategies and resilient system design.