معرفی
Dr. Thomas Ziemann is a Lecturer at the Department of Information Technology and Electrical Engineering at ETH Zürich. His research focuses on power electronics, semiconductor devices, and their reliability in high-performance applications. He specializes in silicon carbide (SiC) power MOSFETs and silicon (Si) IGBTs, with an emphasis on thermal management, electrothermal modeling, and packaging reliability.
- Affiliation: ETH Zürich, Department of Information Technology and Electrical Engineering
Research interests include:
- Advanced power semiconductor devices and their characterization under extreme conditions
- Thermal and electro-thermo-mechanical modeling of power modules
- Optimization of printed circuit board (PCB) layouts for reduced switching losses and electromagnetic interference (EMI)
- Reliability analysis of power electronics components under power cycling and thermal stress
Recent contributions highlight work on EV charger applications using Si IGBTs in zero-current switching (ZCS) configurations, SiC MOSFET reliability in discrete and modular packaging, and 3D electrothermal modeling of multichip power modules. His research bridges device physics, circuit design, and system-level reliability, with applications in renewable energy and high-efficiency power conversion.
