معرفی
Niko Oinonen is a Visiting Professor at the Department of Applied Physics, Aalto University, specializing in scanning probe microscopy and atomic force microscopy (AFM) techniques. His research focuses on integrating machine learning with nanoscale surface analysis to automate tip functionalization, image interpretation, and structure discovery. Collaborations include researchers from Aalto University and international institutions.
Research Trends: Recent work emphasizes computational methods for AFM image analysis, automated microscopy workflows, and machine learning-driven molecular reconstruction. Publications span journals like ACS Nano, Computer Physics Communications, and Science Advances.
Contact: Email: ext-niko.oinonen@aalto.fi
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