معرفی
Dr. Justinas Glemža is a Researcher at the Institute of Applied Electrodynamics and Telecommunications (IAET) of Vilnius University, specializing in low-frequency noise analysis in electronic and optoelectronic devices. His work focuses on noise origin in semiconductors and reliability assessment of laser diodes and LEDs.
His research explores semiconductor material defects, device stability, and noise spectroscopy techniques, with key publications in journals like Diamond and Related Materials and Materials. He has supervised 3 bachelor theses since 2019.
Dr. Glemža’s publications from 2015–2022 address noise characterization in GaAsBi, GaSb-based lasers, and graphene/Si junctions, reflecting expertise in semiconductor reliability and optoelectronic device physics. His work contributes to understanding defect-driven noise mechanisms and long-term device degradation.
