Jonathan D. Ellis

Jonathan D. Ellis is an Assistant Professor at the University of Rochester with a joint appointment in the Department of Mechanical Engineering and The Institute of Optics. His research focuses on developing novel metrology instruments to enhance manufacturing processes through precision measurement and system integration.

Education:

• PhD in Mechanical Engineering, Delft University of Technology (2010)
• MSc and BS in Mechanical Engineering, University of North Carolina at Charlotte

Research Interests:

• Metrology and precision engineering
• Optical sensor development for remote displacement sensing
• Multi-DOF interferometry
• Linear displacement interferometry
• High power gas laser frequency stabilization
• Refractometry
• Flexure systems and precision actuation
• Stage metrology for precision systems
• Capacitance sensor design
• Custom system integration for metrology tools