Haluk Konuk

Haluk Konuk is a Visiting Professor at the Faculty of Engineering, Özyeğin University. With a PhD in Electrical Engineering from the University of California, Santa Cruz (1996), he specializes in VLSI testing, Design for Testability, and Electronic Design Automation. He worked at Hewlett-Packard/Agilent Technologies and Broadcom Corporation for over 25 years, contributing to the development of critical internet infrastructure ASICs and processors. Since 2021, he has founded Palo Alto Test Technologies, focusing on advanced testing solutions.

• PhD in Electrical Engineering, University of California, Santa Cruz (1996)
• MS in Electrical Engineering, Case Western Reserve University (1989)
• BS in Electrical & Electronics Engineering, Boğaziçi University (1986)

His research focuses on Design for Testability (DFT), Automatic Test Pattern Generation (ATPG), and Electronic Design Automation (EDA), addressing challenges in VLSI and CMOS circuit testing. His work includes modeling open-defects, fault simulation, and optimizing test efficiency for digital circuits.

Haluk Konuk's publications span test compression, delay fault testing, and fault modeling, reflecting his long-term contributions to VLSI test methodologies. He holds 9 U.S. patents and has served on IEEE conference program committees.

• Fulbright Scholarship
• 9 U.S. Patents in VLSI Test Technology