معرفی
Adit Singh is the Godbold Endowed Chair Professor in the Department of Electrical and Computer Engineering at Auburn University's College of Engineering. He holds a Ph.D. and M.S. in Electrical Engineering from Virginia Tech and a B.S. (B.Tech.) from IIT Kanpur. He previously served on the faculty at the University of Massachusetts and Virginia Tech, and has held visiting professorships at the University of Freiburg (2012), University of Tokyo (2018), and is scheduled to be a Guest Professor at the University of Stuttgart in Fall 2025.
His research centers on VLSI design, integrated circuit testing, reliability, and design for testability. He is renowned for pioneering statistical and adaptive testing methods in semiconductor validation. His work spans digital systems, computer architecture, and electronic design automation (EDA), with strong industrial impact through licensed patents and consulting for major semiconductor and EDA firms.
Professor Singh has authored over 300 research papers and holds international patents. He has led numerous IEEE conferences as General or Program Chair and served on editorial boards, including IEEE Design and Test. He chaired the IEEE Test Technology Technical Council (2007–2011) and was on the Board of Governors of the IEEE Council on Design Automation (2011–2015).
His scientific honors include IEEE Life Fellowship, IEEE Computer Society Golden Core Membership, and the 2021 Auburn University Award for Excellence in Faculty Outreach. He actively mentors students and collaborates globally, with ongoing research projects in resilient computing and transistor-level reliability.
- Ph.D., Electrical Engineering, Virginia Tech
- M.S., Electrical Engineering, Virginia Tech
- B.S. (B.Tech.), Electrical Engineering, Indian Institute of Technology-Kanpur
Scientific Awards:
- IEEE Life Fellow
- Golden Core Member, IEEE Computer Society
- Auburn University 2021 Award for Excellence in Faculty Outreach
Professor Singh has led major research initiatives, including one of only five resilient computing projects funded by the Open Compute Project. His work bridges academia and industry, serving as an expert witness in patent litigation and advising semiconductor leaders worldwide. He leads a dynamic research group at Auburn focused on next-generation VLSI test methodologies.
