معرفی
Goran S. Ristic is a Full Professor at the Faculty of Electronic Engineering, University of Nis, Serbia, since 2004. He holds a PhD in Semiconductor Physics from the same institution (1998), preceded by a master's (1994) and bachelor's degree (1990) in Physics. His research focuses on semiconductor materials, radiation effects on electronic devices, and dosimetry systems. He has published widely in journals like Journal of Applied Physics and IEEE Transactions, with over 69 papers in impact-factor journals. His work includes developing microcontroller-based dosimeter systems and studying defect behaviors in MOSFETs under irradiation and high electric fields.
Key research interests include radiation-induced defects in semiconductors, annealing processes, and applications in medical dosimetry. He leads the Applied Physics Laboratory (website: http://www.apl.elfak.rs/). Current projects involve 1 national and 1 international collaboration. His contributions span semiconductor device reliability, gas breakdown measurements, and radiation-hardened electronics.
Contact details: Email, Phone: +381 (18) 529-329, Address: Aleksandra Medvedeva 4, 18104 Nis, Serbia.
