معرفی
Milić M. Pejović is an Associate Professor at the Faculty of Electronic Engineering, University of Niš, specializing in Microelectronics and Microsystems. He holds a PhD (2007), MSc (2003), and BSc (1999) in Microelectronics from the same institution. His research focuses on radiation effects in semiconductor devices, plasma processes in low-pressure gases, and electrical breakdown phenomena. He has authored multiple peer-reviewed articles in journals like Radiation Effects and Defects in Solids and Plasma Chemistry and Plasma Processing.
Key research areas include radiation-induced defects in MOSFETs, memory effects in noble gas discharges, and design of radiation sensors using semiconductor materials. His work bridges semiconductor physics with practical applications in dosimetry and overvoltage protection systems.
Active projects include studies on pre/post-penetration processes in gases (2006-2010) and low-pressure gas properties (2001-2005). He contributes to national research initiatives but currently has no listed international collaborations. His lab focuses on advanced semiconductor characterization and plasma diagnostics.
