Claude ALFONSO

Claude ALFONSO is a Lecturer at Aix-Marseille University, affiliated with the Department of Structure and Chemistry of Materials (MATER) and the Microscopy and Electronic Transport in Nanostructures (µTEN) team.

• Research focuses on advanced electron microscopy, nanomaterials, and thin film characterization.
• Specializes in dislocation analysis, grain boundary segregation, and optoelectronic properties of silicon-based nanostructures.

Claude's recent work includes TEM studies of silicon wafer bonding interfaces, Ti segregation mechanisms in CoSi2 films, and synthesis of ferromagnetic MnCoGe thin films. Publications from 2024-2016 highlight expertise in nanoscale materials engineering.

The µTEN team investigates electron transport and structural properties in nanostructures, utilizing techniques like HAADF-STEM, HREM, and APT.

Selected Publications Trends

• 2020-2024: Dislocation networks, silicide interfaces, and lanthanide oxides
• 2016-2017: Optical rectenna design and molecular diode integration
• 2008-2010: Thin film stress analysis and SiGe heterostructures

Technical Expertise

• Transmission Electron Microscopy (TEM)
• Atom Probe Tomography (APT)
• Magnetron Sputtering
• Chemical Etching