Chadwin Young

Dr. Chadwin Young is an Associate Professor at the University of Texas at Dallas, jointly appointed in the Materials Science and Engineering and Electrical Engineering Departments. He holds a B.S. from UT Austin (1996), and M.S. and Ph.D. from North Carolina State University (1998, 2004). His research focuses on electrical characterization methodologies for novel materials and devices, including high-k dielectrics, 2D semiconductors (e.g., MoS₂), and flexible electronics. He is a Senior Member of IEEE and recipient of the NSF CAREER Award. His work emphasizes reliability assessment, interface engineering, and device physics for future nanoelectronics and energy-efficient systems.

Education:

• B.S., Electrical Engineering, University of Texas at Austin
• M.S. & Ph.D., Electrical Engineering, North Carolina State University

Research Interests:

• Electrical characterization of novel materials (e.g., β-Ga₂O₃, TMDs)
• Reliability methodologies for nanodevices
• Flexible and large-area electronics
• MOS modeling and quantum effects
• Future energy technologies

Key Contributions:

• Developed novel characterization techniques for high-k gate stacks at SEMATECH
• Authored/co-authored 240+ peer-reviewed publications
• Active in technical committees for International Reliability Physics Symposium and IEEE International Electron Devices Meeting

Labs/Teams: Director of the eCOMETS Lab, collaborating with industry partners like Everbeing Int'l Corp. for electrical measurement tools.