Alain Kreisler

Alain Kreisler is a leading researcher at the Electrical and Electronic Engineering of Paris, specializing in advanced materials and terahertz technology. His work focuses on superconducting and semiconducting oxides, particularly Y-Ba-Cu-O thin films, for applications in THz imaging, bolometers, and high-frequency sensors. Collaborating extensively with institutions and researchers like Annick Degardin, he explores thin film characterization, dielectric properties, and device design for uncooled detectors and continuous-wave imaging systems.

Key research areas include:

• Development of YBCO-based bolometers for high-sensitivity THz detection.
• Investigation of thin film materials for infrared and THz sensor applications.
• Optimization of micro-antennas and beam multiplexing techniques for THz systems.
• Material durability and embedding challenges for superconducting devices.

His recent work emphasizes cross-disciplinary approaches, combining material science, electronics engineering, and physics to advance terahertz technology for imaging and sensing.