Siewert F.

Siewert F. is a researcher at DESY (Deutsches Elektronen-Synchrotron) in Hamburg, Germany, working within the Photon Science division. His research focuses on the development and characterization of advanced optical components for synchrotron and free-electron laser facilities, particularly in the extreme ultraviolet (XUV) spectral range.

His primary research interests involve precision metrology of optical elements used in cutting-edge light sources. Siewert specializes in slope-measuring deflectometry techniques for characterizing ultra-precise XUV-focusing mirrors and diffraction gratings. His work enables the development of high-resolution spectrometers and focusing optics essential for advanced experiments at facilities like PETRA III and FLASH. His research directly impacts the performance capabilities of modern synchrotron and free-electron laser beamlines by ensuring optical components meet the stringent requirements necessary for state-of-the-art experiments in physics, chemistry, and materials science.

Siewert's publication record demonstrates expertise in optical metrology techniques applied to XUV instrumentation. His work bridges the gap between theoretical optical design and practical implementation, with a strong emphasis on measurement accuracy and precision. The consistent focus on metrology across his publications indicates a specialized research trajectory centered on ensuring the quality and performance of optical components for advanced light sources.