Richard Hailstone

Richard Hailstone is an Associate Professor at the Chester F. Carlson Center for Imaging Science within the College of Science at Rochester Institute of Technology (RIT). His work focuses on electron microscopy and materials characterization, with expertise in Transmission Electron Microscopy (TEM), Scanning Electron Microscopy (SEM), and Nuclear Magnetic Resonance Spectroscopy.

• Education: BS from Northern Illinois University, MS from Indiana University

Research interests include improving scanning electron microscope resolution through point spread function determination and image restoration, alkali-activated materials for sustainable cement, and self-healing thermoplastic blends. He collaborates with industry and academic partners such as Eric Lifshin (SUNY Polytechnic), Nathan Cahill (RIT), and Brian Landi (RIT), with recent publications on quantum dots, carbon dots, and SEM wave optics.

He manages the NanoImaging Laboratory at RIT, which houses advanced equipment like Tescan Mira3 and Zeiss Supra 40 VP SEMs, JEOL TEMs, and software tools like Nanojehm's Aura system for PSF analysis. Students under his mentorship, including Surya Kamal and Kevin Mogere Nyaburi, contribute to projects on nanomaterials and imaging algorithms.