معرفی
Peter H. Aaen is a Reader in Microwave Semiconductor Device Modeling at the University of Surrey, with expertise in RF and microwave device modeling and characterization. His work focuses on developing advanced methodologies for high-power and high-frequency electronic devices, with applications in telecommunications and quantum technologies.
Dr. Aaen received his B.A.Sc. in Engineering Science and M.A.Sc. in Electrical Engineering from the University of Toronto, Canada, and his Ph.D. in Electrical Engineering from Arizona State University, USA, in 1995, 1997, and 2005 respectively. Prior to joining the University of Surrey, he was the manager of the RF Modeling and Measurement Technology team at Freescale Semiconductor Inc (formerly Motorola Inc.), bringing significant industry experience to his academic work.
Dr. Aaen's research spans several critical areas in microwave engineering, with a particular emphasis on developing multi-physics based modeling methodologies for high-power and high-frequency electronic devices. His expertise includes calibration techniques for microwave measurements, package modeling, development of compact models for microwave power transistors and RFICs, and efficient electromagnetic simulation methodologies for complex packaged environments. He has made significant contributions to understanding frequency dispersion in RF LDMOS transistors, electro-thermal modeling, and the development of measurement techniques for extreme impedance devices.
His publication record demonstrates a clear progression from fundamental device modeling to advanced measurement techniques and applications in next-generation communications systems. Recent work has focused on multiphysics measurements, electro-optic field imaging, and the application of nanowire technologies to microwave switches, reflecting the evolving challenges in 5G and beyond communications infrastructure.
Dr. Aaen is a Senior Member of the IEEE and active in several technical committees including the IEEE Technical Committee (MTT-1) on Computer-Aided Design, the technical program committee of the IEEE Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS), and the executive committee of the Automatic RF Techniques Group (ARFTG).
Dr. Aaen has supervised numerous PhD students whose research has advanced the field of microwave engineering, particularly in areas related to measurement uncertainty, multiphysics characterization of high-power transistors, and nanoscale device integration. His collaborative work spans multiple institutions and has resulted in significant advancements in understanding device behavior under complex operating conditions.
His laboratory work focuses on developing novel measurement techniques that combine electro-optic systems with nonlinear vector network analyzers and load-pull measurement systems, enabling unprecedented visualization of electromagnetic field distributions within operating transistors. This work has led to breakthroughs in understanding oscillation mechanisms and thermal behavior in high-power devices.
