
معرفی
Paul Anthony Midgley is a distinguished Professor of Materials Science in the Department of Materials Science and Metallurgy at the University of Cambridge and a fellow of Peterhouse, Cambridge. His research has established him as a world leader in advanced electron microscopy techniques, particularly in the development and application of electron tomography for 3D materials characterization at the nanoscale.
Midgley's research program focuses on several cutting-edge areas of electron microscopy:
- Electron tomography for 3D characterization of materials and heterogeneous catalysts
- Electron holography for mapping electric fields and dopant distributions in semiconductor devices
- Energy-filtered imaging techniques
- Ab initio structure determination by electron diffraction
- Nanotomography applications across chemical, biological and materials sciences
- Characterization of carbon nanotubes and other nanomaterials
His publication record demonstrates consistent innovation in electron microscopy methodology, with recent work focusing on pushing the boundaries of 3D imaging at the nanoscale. Midgley's research bridges fundamental methodology development with practical applications in materials science, catalysis, and semiconductor physics, showing particular strength in translating advanced imaging techniques to solve complex materials problems.
His major recognition includes:
- Election as Fellow of the Royal Society (FRS) in 2014, with the citation highlighting his pioneering development of sub-nanometre-scale electron tomography and revolutionary combination of high-angle dark field tomography with spectroscopy
Midgley's research has been consistently supported by major funding bodies including the Engineering and Physical Sciences Research Council (EPSRC), the Royal Commission for the Exhibition of 1851, and the Royal Society. He has established significant collaborations with leading researchers including Mark Welland, Rafal Dunin-Borkowski, Neil Mathur, John Meurig Thomas, Brian F. G. Johnson, and Henning Sirringhaus, reflecting his central position in the international materials science community.
At Cambridge, Midgley leads a research group focused on advancing electron microscopy techniques, particularly developing and applying tomography and holography methods for comprehensive 3D characterization of materials at the nanoscale, with applications spanning semiconductor devices, catalysts, and biological systems.



