Navid Asadi

Navid Asadi is an Associate Professor in the Electrical & Computer Engineering Department at the University of Florida, affiliated with the Materials Science & Engineering department. He leads the Security and Assurance (SCAN) Lab, equipped with $12M in advanced imaging tools, and serves as Associate Director of the Florida Semiconductor Institute and the Microelectronics Security Training (MEST) center. His research focuses on hardware security, reverse engineering, 3D imaging, and semiconductor assurance. Dr. Asadi has received NSF CAREER (2022) and multiple best paper awards, including from IEEE HOST and ASME ISFA. He pioneered the IEEE PAINE conference and collaborates with agencies like NSF, AFRL, and industry partners.

Education:

• PhD, Mechanical Engineering, University of Connecticut, 2014
• MS, Biomedical Engineering, Amir Kabir University of Technology, 2009
• BS, Mechanical Engineering, K.N. Toosi University of Technology, 2007

Research Interests: Dr. Asadi’s work spans hardware security mechanisms, advanced packaging inspection, AI-driven defect detection, and semiconductor supply chain assurance. He develops novel techniques for X-ray compatibility metrics, PCB inspection via deep learning, and physical security of silicon photonics. His lab addresses challenges in heterogeneous integration, counterfeit detection, and runtime system-on-chip (SoC) validation.

Awards:

• NSF CAREER Award (2022)
• Best Paper Award, HOST International Conference (2016)
• D.E. Crow Innovation Award (University of Connecticut)

Labs & Initiatives: Directs the SCAN Lab and oversees the MEST center, training engineers in microelectronics security. His work integrates quantum sensing, THz spectroscopy, and optical neural networks to enhance hardware assurance. Current projects include AI-driven inspection systems, chiplet authentication (ChiPICA), and defense against probing attacks.