معرفی
Michel Bosman is an Associate Professor at the National University of Singapore's (NUS) Department of Materials Science and Engineering, and a Faculty Member of the NUS Graduate School for Integrative Sciences and Engineering (ISEP/NGS). He holds a joint Senior Scientist position at A*STAR's Institute of Materials Research and Engineering (IMRE). His research focuses on atomic-scale materials characterization using advanced electron microscopy techniques, particularly in microelectronics, nano-optics, and green energy applications. Key methods include thin film growth, nanofabrication, and aberration-corrected scanning transmission electron microscopy (STEM).
His work bridges fundamental science and practical applications, with a focus on materials such as thermoelectrics, 2D semiconductors, and plasmonic nanostructures. He teaches courses including MST5002 (Materials Characterization), MLE4212 (Advanced Structural Materials), and MLE5216 (Introduction to Microscopy for Materials Research). Recent publications highlight breakthroughs in atomic-scale defect analysis, thermoelectric performance optimization, and novel plasmonic systems. His research has been featured in top journals like Nature Communications, Advanced Materials, and Light: Science & Applications.
Dr. Bosman actively mentors PhD students pursuing NGS or A*STAR scholarships, emphasizing experimental and theoretical approaches to material innovation. His lab develops cutting-edge imaging techniques such as single-shot 3D metrology and ptychography for nanoscale visualization.
