Leeor Alon

Leeor Alon, PhD, is an Assistant Professor in the Department of Radiology at NYU Grossman School of Medicine. His research focuses on advancing medical imaging safety, MRI technology optimization, and biomedical engineering innovations. He holds a PhD from New York University.

Alon's work emphasizes the development of open-source medical devices, such as ultra-low-field MRI systems and 3D-printed animal imaging platforms. His research integrates cutting-edge techniques like deep learning for hemorrhage detection and electromagnetic field analysis for RF safety. He has contributed to understanding risks associated with brain-implanted conductors and RF exposure in rodents, alongside pioneering temperature-regulated MRI systems for preclinical studies.

His publications highlight interdisciplinary approaches, combining engineering, physics, and biology to address challenges in MRI safety, thermometry, and biomedical instrumentation. Collaborations span neuroimaging, material science, and clinical diagnostics, reflecting his commitment to bridging theoretical and applied research.