معرفی
Prof. Juin J. Liou serves as the UCF Pegasus Distinguished Professor and Lockheed Martin St. Laurent Professor of Engineering in the Department of Electrical and Computer Engineering at the University of Central Florida, where he has held faculty positions since 1987.
Education:
- B.S. (Honors) in Electrical Engineering, University of Florida, 1982
- M.S. in Electrical Engineering, University of Florida, 1983
- Ph.D. in Electrical Engineering, University of Florida, 1987
Research Focus: Prof. Liou specializes in Electrostatic Discharge (ESD) protection systems critical for integrated circuit reliability, semiconductor device modeling, and RF circuit design. His pioneering work addresses ESD challenges in next-generation technologies including silicon nanowire, organic semiconductors, and gallium nitride (GaN) devices, where miniaturization intensifies vulnerability to electrostatic damage. His research bridges theoretical modeling with practical implementation to solve industry-critical protection failures.
Awards and Leadership:
- Ten teaching/research excellence awards from University of Central Florida
- Six major awards from IEEE
- IEEE-EDS Distinguished Lecturer
- Multiple honorary professorships
Research Impact: Secured over $14.5 million in funding from NSF, DARPA, NASA, NIST, and semiconductor industry leaders including Intel, Texas Instruments, and Analog Devices. Authored 10 books, 270+ journal papers (18 invited reviews), and 220+ conference papers while holding 8 U.S. patents (4 pending). Served as IEEE EDS Vice-President, Treasurer, and Board of Governors member, plus editorial roles for Microelectronics Reliability and IEEE journals.
