معرفی
Jovan Brankov is a Professor of Electrical and Computer Engineering and Biomedical Engineering at the Illinois Institute of Technology (IIT), within the Armour College of Engineering. He joined IIT in 2002 as a researcher, became Research Assistant Professor in 2004, and was promoted to Assistant Professor in 2008. His research focuses on medical imaging, image sequence processing, pattern recognition, and data mining, with emphasis on biomedical applications such as tumor detection, motion tracking, and tomographic reconstruction methods.
Education: Ph.D. in Electrical Engineering from IIT (2002), M.Sc. from IIT (1999), and Dipl. Ing. from the University of Belgrade (1996).
Research interests include medical image quality assessment, multiple-image radiography, 4D/5D tomographic reconstruction, and the ADEPT cancer imager. He leads the Advanced X-ray Imaging Laboratory (AXIL) at IIT, which develops phase-sensitive x-ray imaging technologies.
Key awards include the IOP Select Award (2006), AIP Editor's Pick (2015), and Nayar Prize phases I (2015) and II (2016). He serves as an associate editor for IEEE Transactions on Medical Imaging, Medical Physics, and SPIE's Journal of Medical Imaging.
His work spans over 150 publications, including peer-reviewed articles and a book chapter. Ongoing projects involve deep learning applications in SPECT imaging, fluorescence-guided surgery, and paired-agent imaging for cancer detection.
