معرفی
Jean-Luc Autran is an Exceptional University Professor (PRCE2) at Aix-Marseille University, affiliated with the Department of Detection, Radiation and Reliability (DETECT) within the Faculty of Sciences. Since July 2023, he has been temporarily assigned to the University of Rennes for managerial roles. His research focuses on radiation effects in microelectronics, particularly soft errors caused by atmospheric neutrons, muons, protons, and terrestrial radiation in nanoscale devices.
- Key Research Areas: Microelectronics Reliability, Single-Event Effects, Atmospheric Radiation, Neutron Interactions, Muon Physics, Radiation-Hardened Design.
Scientific Leadership: As an Honorary Member of the Institut Universitaire de France (since 2003), he leads multidisciplinary efforts from radiation metrology to multi-physics circuit simulation via tools like GEANT4, SRIM, and NGSPICE. His work spans 25+ years, evolving from quantum transport in nano-MOSFETs (1998-2008) to atmospheric radiation effects (2005-present).
Recent Contributions: 2025 studies on ultrawide-bandgap semiconductors, deep learning-based radiation simulations, and JET Tokamak neutron experiments. He pioneers a multi-scale Single-Event Effect simulation framework for decananometer CMOS, integrating particle physics, device modeling, and system-level error rate prediction.
- Scientific Awards: Honorary Member, Institut Universitaire de France (2003 class).
Educational Impact: Teaches graduate courses in quantum mechanics simulation, nanoelectronics reliability, and radiation detection at Aix-Marseille University, with lectures delivered in English for international audiences.
