معرفی
Eric E. Fullerton is a Professor and Endowed Chair in the Department of Electrical and Computer Engineering at the University of California, San Diego (UCSD), within the Jacobs School of Engineering. He serves as Director of the Center for Memory and Recording Research (CMRR) and has previously held research leadership roles at Hitachi Global Storage Technologies and IBM Almaden Research Center. His research is partially funded by the National Science Foundation.
Dr. Fullerton’s research focuses on magnetic recording and nano-technologies, thin film and superlattice growth, interfacial and thin-film magnetism, and x-ray and neutron scattering. He is internationally recognized for his work on magnetic materials for high-density data storage, spin-transfer torque, exchange-spring systems, and advanced magnetic characterization techniques. His expertise bridges fundamental physics with practical applications in data storage and spintronics.
His recent publications reveal a strong emphasis on perpendicular magnetic anisotropy, spin-transfer torque switching, bit-patterned media, magnetic domain dynamics, and nanoscale magnetic imaging. These works often employ advanced x-ray and neutron scattering methods to probe magnetic and structural properties at the atomic level, contributing significantly to the understanding of magnetization reversal, domain wall motion, and thermal stability in nanomagnetic systems.
- Fellow of the American Physical Society
- Exceptional Achievement Award, Argonne National Laboratory
- IBM Outstanding Achievement Award
- IBM Fourth Plateau Invention Achievement Award
Dr. Fullerton has advised numerous students and collaborated extensively with researchers across institutions. His work has been instrumental in advancing magnetic recording technologies and nanomagnetism. He leads a research group focused on magnetic materials and devices, with ongoing projects involving magnetic memory, spintronics, and nanofabrication. His lab utilizes state-of-the-art facilities for thin-film growth, magnetic characterization, and device testing.
