معرفی
Duncan M. Walker is an Associate Dean for Graduate Programs and Professor in the Department of Computer Science & Engineering at Texas A&M University. He holds a Ph.D. in Computer Science from Carnegie Mellon University (1986) and has been a faculty member since 2006. His research focuses on integrated circuit testing, defect-based testing, delay faults, IDDQ testing, fault diagnosis, and yield prediction.
Walker has held leadership roles including Department Head (2011–2013) and Graduate Advisor. His awards include the ACM Distinguished Scientist (2014), Charles W. Crawford Service Award (2009–2010), and multiple Texas A&M fellowships. He teaches courses on software engineering and professional development for faculty.
His research lab (EDA Lab) explores cutting-edge testing methodologies for VLSI circuits, including resistive fault modeling, outlier identification using neighbor current ratios, and parametric yield analysis. Recent work addresses challenges in deep-submicron IC testing and built-in current sensor design.
- Education: B.S. (Caltech, 1979), M.S. (CMU, 1984), Ph.D. (CMU, 1986)
- Professional Activities: IEEE Test Conference Program Committee (2020–present), Design Automation & Test in Europe (2018–present)
- Labs/Teams: EDA Lab, collaborating on defect-based testing and fault modeling
Publications emphasize practical testing solutions for emerging semiconductor technologies, with over 40 refereed papers in venues like IEEE VLSI Test Symposium and IEEE Transactions on CAD.
