Daehyun Yoon

Dr. Daehyun Yoon is an Assistant Professor and Assistant Adjunct Professor at the University of California, San Francisco (UCSF), focusing on medical imaging techniques for musculoskeletal pain diagnosis. He specializes in PET/MRI and MRI methods to identify pain generators in chronic conditions like low back pain, complex regional pain syndrome, and CSF leaks. His research also addresses metallic implant-related MRI artifacts and high-resolution neuroimaging.

Education:

• PhD, 2012: Electrical Engineering, University of Michigan
• M.S., 2007: Electrical Engineering, University of Michigan
• B.S., 2004: Computer Science & Engineering, Seoul National University
• Postdoctoral Fellowship: Stanford University (2016), focusing on MRI near metal

Research Interests: Dr. Yoon’s work integrates advanced imaging technologies to improve clinical protocols for pain management. His NIH-funded project (NIAMS) explores [18F]FDG PET/MRI near hip implants to identify post-surgical pain sources. He develops artifact-free MRI techniques for metallic implants and high-resolution imaging of peripheral nerves.

Grants & Collaborations:

• Co-investigator on an NIH/NIAMS-funded project studying hip implant-associated pain
• Collaborations with Stanford University, Seoul National University, and industry partners

His work bridges biomedical engineering, radiology, and clinical pain management to translate research into patient care.

Labs & Teams: Engaged in UCSF’s radiology and biomedical imaging research groups, focusing on multimodal imaging and musculoskeletal pain diagnostics.