Carsten Fallnich

Professor Carsten Fallnich is a Full Professor for Applied Physics at the Institute of Applied Physics, University of Münster, and also holds a position as Professor for Ultrafast Photonic Technologies at the University of Twente since 2014. He leads the Optical Technologies working group, which focuses on cutting-edge research in nonlinear microscopy, light conversion in waveguides, and transverse modes. His work has significant applications in biomedical imaging, chemical analysis, and advanced optical technologies.

Professor Fallnich completed his physics studies at the University of Hannover (1986-1992), earned his doctorate at the University of Kaiserslautern (1992-1995), and completed his habilitation in Physics at the University of Hannover in 2004. His career path included leadership roles at Laserzentrum Hannover e.V. (1997-2005) and PTB Braunschweig (2005-2006) before joining the University of Münster in 2006.

His research spans multiple advanced optical techniques including coherent anti-Stokes Raman scattering (CARS), stimulated Raman scattering (SRS), and multimodal microscopy for label-free cellular imaging. Recent publications reveal a strong focus on waveguide-based optical parametric oscillators, transverse mode-locked beams, and noise-reduction techniques in Raman microscopy. His work demonstrates a clear trajectory toward miniaturization of optical systems, improved imaging contrast, and enhanced chemical specificity in biological applications.

Professor Fallnich actively supervises doctoral students and has developed numerous advanced optical systems with applications in biomedical imaging. His group regularly participates in major international conferences including Photonics West, CLEO/Europe, and RamanFest, often collaborating with institutions like Harvard Medical School's Wellman Center for Photomedicine. The Optical Technologies group maintains state-of-the-art laboratories with specialized optical tables and equipment for sensitive measurements in nonlinear optics and microscopy.