Aimo Winkelmann

Dr. Aimo Winkelmann is a Visiting Professor in the Department of Physics at the University of Strathclyde, United Kingdom. His research is centered on advanced electron microscopy techniques, particularly electron backscatter diffraction (EBSD), for the structural characterization of semiconductor thin films and microstructures.

His research interests lie at the intersection of materials science, solid-state physics, and microstructural analysis. He specializes in:

• High-resolution crystallographic imaging
• Strain and defect mapping in semiconductors
• Development of EBSD and transmission Kikuchi diffraction methods
• Analysis of GaN and silicon-based thin films
• Simulation and interpretation of electron diffraction patterns

His recent publications demonstrate a consistent focus on pushing the limits of diffraction imaging in scanning electron microscopes. The work spans from fundamental simulations of Kikuchi patterns to applied studies on strain in silicon membranes and luminescence in GaN microstructures, indicating a strong trend toward quantitative microstructural analysis in functional materials.

Dr. Winkelmann has delivered invited and plenary talks at major international conferences, including the XVIIIth International Conference on Electron Microscopy (2024) and the Materials Research Society Fall Meeting (2023), highlighting his recognition in the field.

He actively collaborates with a core research team at Strathclyde, including Prof. Carol Trager-Cowan, Dr. Jochen Bruckbauer, and Dr. Ben Hourahine, and contributes to open datasets supporting reproducibility in EBSD research. While no formal students are listed, his role in mentoring through collaborative research is evident.