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Jens LienigView profile

Professor

• Electronic Design Automation
• Electromigration
• 3D Integrated Circuit Design
• +5 more

Jens Lienig has been a Professor at Technische Universität Dresden since 2002, where he directs the Chair of Development and Design of Precision Engineering and Electronics. His research spans Electronic Design Automation (EDA), electromigration analysis, 3D IC design, constraint-driven methodologies, and precision device development. He holds memberships in IEEE, VDE/VDI GMM, and technical committees, and has led conferences like ISPD 2021 as General Chair. Research interests focus on: Reliability Engineering : Electromigration-aware IC design, thermal/stress modeling in interconnects. Advanced Design Automation : 3D physical design algorithms, analog layout generators, constraint propagation. Precision Devices : MEMS sensors, peristaltic pumps, SAW motors, pyroelectric detectors. Recent articles (2019–2025) emphasize electromigration robustness, aerosol sensor signal processing, and open-source EDA tools. Over 15 doctoral students have completed under his supervision, including dissertations on electromigration, MEMS, and infrared sensors.

Arie RuzinView profile

Professor

• Semiconductor Detectors
• Radiation Effects in Semiconductors
• Compound Semiconductors
• +3 more

Prof. Arie Ruzin is a faculty member at the School of Electrical Engineering, Tel Aviv University, affiliated with the Department of Physical Electronics. His research focuses on semiconductor detectors for radiation and particle detection, with applications in medical imaging, non-destructive testing, and high-energy physics experiments. Research Interests Prof. Ruzin's work spans several key areas: Development of compound semiconductor detectors (CdZnTe, InSb, SiGe) for X-ray, gamma-ray, and particle detection Investigation of radiation-induced defects in semiconductors and radiation-hardness enhancement techniques Device simulation (1D/2D/3D) of novel semiconductor structures Nano-contact physics and atomic force microscopy (AFM) characterization Novel semiconductor materials including 2D materials and compensated semiconductors His research often involves collaborations with international institutions like CERN's RD50 Collaboration. Publications Overview Recent publications (2010-2015) demonstrate a strong focus on semiconductor contact physics, radiation detector optimization, and nano-scale characterization. Key themes include modeling of ohmic/Schottky contacts, radiation damage simulations in CdZnTe/SiGe, and nano-contact behavior. The work consistently applies advanced simulation techniques alongside experimental validation. Student Advising Prof. Ruzin actively recruits graduate students (M.Sc./D.Sc.) for research projects involving: Radiation detector development and characterization Semiconductor device simulation AFM-based nano-scale measurements VLSI circuit design for detector systems He also mentors undergraduate students in projects related to LabVIEW programming, electronic measurements, and VLSI design. Laboratory Activities He leads a research laboratory equipped for semiconductor device characterization, including atomic force microscopy (AFM), deep-level transient spectroscopy (DLTS), and radiation testing capabilities. The group participates in the CERN RD50 collaboration focusing on radiation-hard semiconductor detectors for high-energy physics experiments.