About
Xavier Maeder is a Lecturer at the Swiss Federal Institute of Technology Lausanne (EPFL), affiliated with the EDMX-ENS unit under the VPA-AVP-DLE administrative structure. His teaching focuses on advanced materials characterization techniques, particularly X-ray analysis for thin films and structural properties, as well as dual-beam SEM/FIB microanalysis.
- Teaching role spans theoretical and practical aspects of X-ray scattering (coherent/non-coherent) and high-resolution techniques
- Supervises PhD students while emphasizing technological transfer applications
Research interests center on materials science, specifically microstructural analysis of thin films and coatings. His expertise bridges structural-physical property correlations and stress analysis in materials engineering.
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