Alex Dommann

Alex Dommann is a Lecturer at École polytechnique fédérale de Lausanne (EPFL), affiliated with the EDMX-ENS unit under the Vice Presidency for Academic Affairs (VPA-AVP-DLE) and its sub-division AVP-DLE-EDOC. His teaching focuses on advanced X-ray analysis methods for thin films and coatings.

• Course 1: X-Ray Analysis for thin films - Covers physical and structural property relationships, scattering techniques, and technological applications.
• Course 2: CCMX Advanced Course - Explores strain, defects, and deformation analysis in thin films using high-resolution X-ray diffraction.

His research interests align with his teaching, emphasizing material characterization through X-ray techniques, structural analysis of thin films, and the interplay between microstructure and mechanical properties like stress. This work has direct implications for improving coatings and technological transfer in materials science.