Tom J.F. Verstijnen

Tom J.F. Verstijnen is a doctoral candidate at the Eindhoven University of Technology, affiliated with the Department of Photonics and Semiconductor Nanophysics. His research focuses on atomic-scale analysis of doping effects in III-V semiconductors, leveraging advanced techniques such as cross-sectional scanning tunneling microscopy (X-STM) and density functional theory (DFT).