Morten Kildemo is a Professor in the Department of Physics at the Norwegian University of Science and Technology (NTNU), specializing in advanced optical characterization techniques. His research focuses on developing and applying spectroscopic and Mueller matrix ellipsometry to investigate complex nanostructured materials and photonic devices. His primary research interests include nanoplasmonics, metasurfaces, photonic crystals, and materials for intermediate band solar cells. He pioneers methods for characterizing anisotropic, chiral, and magneto-optical systems, with significant contributions to understanding light-matter interactions in nanoscale architectures. His work bridges experimental physics and materials engineering for next-generation optoelectronic applications. Analysis of his recent publications reveals a strong trend toward polarization-sensitive characterization of engineered nanostructures, particularly for photonic and energy applications. His group consistently advances ellipsometric methodologies to probe complex optical responses in metasurfaces, plasmonic arrays, and quantum-confined systems. Professor Kildemo has supervised multiple doctoral and master's students, including Thomas Vågenes Brakstad (intermediate band materials), Maja Bjerke Drøyli (quantum dot solar cells), Brage Bøe Svendsen (Mueller matrix modeling), and Andreas Liudi Mulyo (quantum dot characterization). His collaborative research spans materials synthesis, optical instrumentation development, and theoretical modeling of nanophotonic systems.