جست‌وجوی استاد و پژوهشگر

• Organic Materials
• Inorganic Materials
• Thin Film Technology
• +۵ مورد دیگر

Dr. Anca STANCULESCU is a Scientific Researcher I at the Laboratory of Optical Processes in Nanostructured Materials, National Institute of Materials Physics (INFIM) in Romania. Her research focuses on the development and characterization of advanced organic and inorganic materials for optoelectronic applications, with expertise spanning thin film technology, crystal growth, and nanomaterials engineering. Her primary research interests include: Organic materials: multifunctional thin films, nanostructured composites, and heterostructures for photovoltaic cells, OLEDs, and transistors Inorganic materials: transparent conducting oxides, semiconductor compounds, and silicon technology Advanced characterization: AFM, SNOM, UV-Vis spectroscopy, FTIR, and electrical measurements Dr. STANCULESCU specializes in laser-based deposition techniques, particularly Matrix Assisted Pulsed Laser Evaporation (MAPLE), for fabricating novel organic-inorganic hybrid systems. Her work demonstrates how strategic integration of inorganic components within organic matrices enhances device performance in terms of electrical conductivity, optical properties, and mechanical flexibility. Analysis of her recent publications (2022-2025) reveals a strong emphasis on flexible optoelectronics, with particular focus on nanostructured electrodes, non-fullerene acceptors for photovoltaics, and the effects of substrate patterning on device performance. Her research consistently bridges fundamental materials science with practical applications in next-generation electronic devices. She currently leads two major research projects: Flexible and nanostructured Organic Field Effect Transistor for UV-VIS detection (2022-2024) Investigation of organic thin films after high-energy ion and neutron irradiation (2020) Dr. STANCULESCU has also contributed to five book chapters on organic semiconductors and optoelectronic materials, establishing herself as a recognized expert in the field. Her laboratory maintains strong expertise in the fabrication and characterization of nanostructured materials, with particular capabilities in laser processing and advanced optoelectronic device development.

• Surface Science
• Interface Science
• Ferroelectric Materials
• +۶ مورد دیگر

Dr. Liviu TANASE is a Scientific Researcher at the National Institute of Materials Physics (NIMP) in Romania, working in the Laboratory of Surface and Interface Science. His research focuses on the characterization of advanced materials using photoelectron spectroscopy and related techniques, with particular emphasis on ferroelectric materials, multiferroics, and carbon-based nanomaterials. Dr. TANASE's research interests span surface science, interface phenomena, and advanced materials characterization. He specializes in using photoelectron spectroscopy to investigate ferroelectric thin films, particularly lead zirconate titanate (PZT), examining polarization states, surface charge dynamics, and interface effects. His work also extends to carbon nanomaterials including carbon dots and nitrogen-doped carbons, where he studies structural properties and their applications in energy conversion and storage. Ferroelectric materials characterization Photoelectron spectromicroscopy techniques Nanoscale polarization phenomena Carbon-based nanomaterials for energy applications Multiferroic systems and phase separation Analysis of Dr. TANASE's recent publications reveals a strong focus on the intersection of surface science and energy applications. His work demonstrates expertise in correlating nanoscale structural features with functional properties, particularly in ferroelectric systems and carbon-based nanomaterials. Key research themes include the relationship between surface polarization and chemical reactivity in ferroelectrics, the structural evolution of carbon dots during synthesis, and the development of advanced materials for photoelectrochemical applications and energy storage. His methodology frequently combines multiple characterization techniques including XPS, LEEM/MEM, and synchrotron radiation to gain comprehensive insights into material properties.