Zivko Kokolanski is a researcher at the Institute for Electrical Measurements and Materials at the Faculty of Electrical Engineering and Information Technologies (FEIT), Ss. Cyril and Methodius University in Skopje (UKIM). He holds a PhD in Electrical Engineering (2013), Master's (2010), and Bachelor's (2007) degrees from FEIT. His research focuses on data acquisition systems, programmable instrumentation, ionizing radiation measurement, and X-Ray Fluorescence. He has conducted international research visits at TU Ilmenau (Germany) and AGH Krakow (Poland), and collaborated with the IAEA on cultural heritage analysis. Key contributions include advancements in sensor-microcontroller interfaces, calibration techniques, and smart grid metering. His work emphasizes improving measurement accuracy and reducing uncertainty in embedded systems. He has authored/co-authored over 25 publications in peer-reviewed journals and conferences, focusing on sensor signal conditioning, real-time data acquisition, and metrological performance optimization. Current affiliations include the Institute for Electrical Measurements and Materials, where he contributes to teaching and applied research in electrical measurements and materials science. His lab activities involve developing cost-effective, high-precision measurement systems for industrial and academic applications.