Wenjing Raoمشاهده پروفایل
دانشیار
- VLSI Test
- Fault-Tolerance
- Reliability
- +۳ مورد دیگر
Wenjing Rao is an Associate Professor at the Department of Electrical and Computer Engineering, College of Engineering, University of Illinois at Chicago (UIC). Her research focuses on VLSI test, fault-tolerance, reliability, and hardware security in emerging nanoelectronic systems. Education: Ph.D. in Computer Science from University of California, San Diego (2008) B.S. in Computer Science from Peking University (2001) Her work explores novel computation paradigms through physical unclonable functions (PUFs), defect-tolerant logic implementation, and scalable fault tolerance in many-processor arrays. Publications emphasize hardware security, reconfiguration strategies, and reliability challenges in nanoscale architectures. Notable honors include the 2017 Harold A. Simon Award for Excellence in Teaching and the 2012 NSF CAREER Award. She has contributed to key journals like IEEE Transactions on Computer-Aided Design and conferences including DATE, ASPDAC, and NANOARCH.











